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13 September 2007 Polarization scattering from a Spectralon calibration sample
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Abstract
The in-plane Mueller matrix bidirectional reflectance distribution function (MMBRDF) is measured for a Spectralon calibration target with a reflectance of 99%. Measurements are acquired using a Mueller matrix active imaging, goniometric polarimeter operated in the near infrared at 1550nm. The Spectralon is measured for both incident and scattering angles from -80 degrees to 80 degrees to within 20 degrees of retro-reflection. A range of polarization states is generated and scattered polarization states are analyzed by means of a dual rotating retarder Mueller matrix polarimeter. Complete Mueller matrix data is measured with a high-resolution camera in image form. Polarization scatter data is presented in Mueller matrix angular arrays. As expected the Spectralon is a strong depolarizer and weak s-plane oriented diattenuator. It was also a weak retarder. Diattenuation and retardance are strongest at horizontal and vertical polarizations, and weakest for circular polarization states.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hannah Noble, Wai-Sze Tiffany Lam, Greg Smith, Stephen McClain, and Russell A. Chipman "Polarization scattering from a Spectralon calibration sample", Proc. SPIE 6682, Polarization Science and Remote Sensing III, 668219 (13 September 2007); https://doi.org/10.1117/12.747483
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