Polarization scattering from a Spectralon calibration sample

Hannah Noble; Wai-Sze Tiffany Lam; Greg Smith; Stephen McClain; Russell A. Chipman

doi:10.1117/12.747483

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13 September 2007 Polarization scattering from a Spectralon calibration sample

Hannah Noble, Wai-Sze Tiffany Lam, Greg Smith, Stephen McClain, Russell A. Chipman

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Proceedings Volume 6682, Polarization Science and Remote Sensing III; 668219 (2007) https://doi.org/10.1117/12.747483
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

The in-plane Mueller matrix bidirectional reflectance distribution function (MMBRDF) is measured for a Spectralon calibration target with a reflectance of 99%. Measurements are acquired using a Mueller matrix active imaging, goniometric polarimeter operated in the near infrared at 1550nm. The Spectralon is measured for both incident and scattering angles from -80 degrees to 80 degrees to within 20 degrees of retro-reflection. A range of polarization states is generated and scattered polarization states are analyzed by means of a dual rotating retarder Mueller matrix polarimeter. Complete Mueller matrix data is measured with a high-resolution camera in image form. Polarization scatter data is presented in Mueller matrix angular arrays. As expected the Spectralon is a strong depolarizer and weak s-plane oriented diattenuator. It was also a weak retarder. Diattenuation and retardance are strongest at horizontal and vertical polarizations, and weakest for circular polarization states.

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Hannah Noble, Wai-Sze Tiffany Lam, Greg Smith, Stephen McClain, and Russell A. Chipman "Polarization scattering from a Spectralon calibration sample", Proc. SPIE 6682, Polarization Science and Remote Sensing III, 668219 (13 September 2007); https://doi.org/10.1117/12.747483

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