HEW simulations and quantification of the microroughness requirements for x-ray telescopes by means of numerical and analytical methods

D. Spiga; G. Cusumano; G. Pareschi

doi:10.1117/12.734814

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20 September 2007 HEW simulations and quantification of the microroughness requirements for x-ray telescopes by means of numerical and analytical methods

D. Spiga, G. Cusumano, G. Pareschi

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Proceedings Volume 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III; 66880H (2007) https://doi.org/10.1117/12.734814
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

Future X-ray telescopes like SIMBOL-X will operate in a wide band of the X-ray spectrum (from 0.1 to 80 keV); these telescopes will extend the optical performances of the existing soft X-ray telescopes to the hard X-ray band, and in particular they will be characterized by a angular resolution (conveniently expressed in terms of HEW, Half-Energy- Width) less than 20 arcsec. However, it is well known that the microroughness of the reflecting surfaces of the optics causes the scattering of X-rays. As a consequence, the imaging quality can be severely degraded. Moreover, the X-ray scattering can be the dominant problem in hard X-rays because its relevance is an increasing function of the photon energy. In this work we consistently apply a numerical method and an analytical one to evaluate the X-ray scattering impact on the HEW of an X-ray optic, as a function of the photon energy: both methods can also include the effects of figure errors in determining the final HEW. A comparison of the results obtained with the two methods for the particular case of the SIMBOL-X X-ray telescope will be presented.

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D. Spiga, G. Cusumano, and G. Pareschi "HEW simulations and quantification of the microroughness requirements for x-ray telescopes by means of numerical and analytical methods", Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880H (20 September 2007); https://doi.org/10.1117/12.734814

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