Translator Disclaimer
20 September 2007 Progress in x-ray optics development with formed glass and Si wafers
Author Affiliations +
The precisely shaped glass sheets and Si wafers are generally considered as the most promising substrates for future large space astronomical X-ray telescopes. Both approaches have demonstrated promising results obtained in the course of last years. In this contribution, we report on continued systematic efforts and analysis in precise shaping of thin glass sheets as well as Si wafers. New results will be briefly presented and discussed. For Si wafers, recent efforts focus also on improving the intrinsic quality of the slices to better meet the high requirements of future space projects.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Hudec, L. Pina, V. Semencova, M. Skulinova, A. Inneman, L. Sveda, M. Mika, R. Kacerovsky, J. Prokop, and M. Cerny "Progress in x-ray optics development with formed glass and Si wafers", Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 668810 (20 September 2007);


Novel technologies for space x-ray optics
Proceedings of SPIE (November 21 2017)
Novel applications of silicon pore optics technology
Proceedings of SPIE (September 17 2012)
Advanced x-ray optics with Si wafers and slumped glass
Proceedings of SPIE (August 31 2009)
Novel technologies for x-ray multi-foil optics
Proceedings of SPIE (August 31 2005)
Recent progress with x ray optics based on Si wafers...
Proceedings of SPIE (July 15 2008)
Novel x-ray optics with Si wafers and formed glass
Proceedings of SPIE (June 13 2006)
Back-up technologies for IXO
Proceedings of SPIE (April 30 2009)

Back to Top