Characterization of thin plastic foils for applications in x-ray optics technology

Angelo Taibi; Marco Barbera; Giovanni Pareschi; Herbert W. Schnopper; Giorgia Sironi; Renzo Valtolina

doi:10.1117/12.737115

20 September 2007 Characterization of thin plastic foils for applications in x-ray optics technology

Angelo Taibi, Marco Barbera, Giovanni Pareschi, Herbert W. Schnopper, Giorgia Sironi, Renzo Valtolina

Proceedings Volume 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III; 66881B (2007) https://doi.org/10.1117/12.737115
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

Thin plastic foils are being investigated to build shell optics for X-ray telescopes. Compared to polished glass optics, the advantage is in terms of increased collecting area, light weight and lower cost. Plastic material is also desirable to allow deformation into a complete surface of revolution. We collected plastic materials of common use for industrial applications and also specialty materials developed for the electronic industry. A comparative study was then performed to evaluate the optical quality of the selected plastic films. Surface analysis was carried out with topographic instruments to investigate the microroughness of our samples at different scan lengths. Preliminary results suggest that a facility for the production of high-performance films with adequate microroughness is needed.

Citation Download Citation

Angelo Taibi, Marco Barbera, Giovanni Pareschi, Herbert W. Schnopper, Giorgia Sironi, and Renzo Valtolina "Characterization of thin plastic foils for applications in x-ray optics technology", Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66881B (20 September 2007); https://doi.org/10.1117/12.737115

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KEYWORDS

Positron emission tomography

X-ray optics

Polymers

Manufacturing

Aluminum

Glasses

Metals

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