Paper
20 December 2007 The relationship between laser fluence profile and the cumulative probability of damage curve
Author Affiliations +
Abstract
The Gaussian profile beam has been de rigeur for damage threshold measurements for decades. This paper formulates the cumulative probability of damage (CPD) curve for the Gaussian and an arbitrary distribution of defects in fluence (intensity) space. It is seen that the CPD for the Gaussian is relatively insensitive to the underlying distribution of defects. The CPD is reformulated for a flat top distribution and shown to be far more influenced by the underlying defect distribution. The paper concludes with a discussion of the relationship between the defect distribution, sample size, threshold and measured threshold, for both the Gaussian and flat top profiles. It will be shown than the CPD for Gaussian beams increases with increasing fluence regardless of the distributions of the defects in fluence. The Flat Top CPD will only increase with increasing defect density.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan W. Arenberg "The relationship between laser fluence profile and the cumulative probability of damage curve", Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 672011 (20 December 2007); https://doi.org/10.1117/12.753054
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Gaussian beams

Laser damage threshold

Laser induced damage

Particles

Data analysis

Deconvolution

Laser applications

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