Comparison of Gaussian and top-hat beam profiles in LIDT testing

L. Jensen; M. Jupe; K. Starke; D. Ristau; W. Riede; P. Allenspacher

doi:10.1117/12.752873

20 December 2007 Comparison of Gaussian and top-hat beam profiles in LIDT testing

L. Jensen, M. Jupe, K. Starke, D. Ristau, W. Riede, P. Allenspacher

Author Affiliations +

Proceedings Volume 6720, Laser-Induced Damage in Optical Materials: 2007; 672013 (2007) https://doi.org/10.1117/12.752873
Event: Boulder Damage Symposium XXXIX: Annual Symposium on Optical Materials for High Power Lasers, 2007, Boulder, Colorado, United States

Abstract

The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM₀₀ as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO₂/SiO₂ high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.

Citation Download Citation

L. Jensen, M. Jupe, K. Starke, D. Ristau, W. Riede, and P. Allenspacher "Comparison of Gaussian and top-hat beam profiles in LIDT testing", Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 672013 (20 December 2007); https://doi.org/10.1117/12.752873

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