Photothermal detuning: a sensitive technique for absorption measurement of optical thin films

Honggang Hao; Bincheng Li; Mingqiang Liu; Yuan Gong

doi:10.1117/12.758949

Translator Disclaimer

20 December 2007 Photothermal detuning: a sensitive technique for absorption measurement of optical thin films

Honggang Hao, Bincheng Li, Mingqiang Liu, Yuan Gong

Author Affiliations +

Proceedings Volume 6720, Laser-Induced Damage in Optical Materials: 2007; 67201D (2007) https://doi.org/10.1117/12.758949
Event: Boulder Damage Symposium XXXIX: Annual Symposium on Optical Materials for High Power Lasers, 2007, Boulder, Colorado, United States

Abstract

A simple and sensitive photothermal technique-photothermal detuning (PTDT), which is based on the absorption-induced shift of reflectance or transmission spectrum of an optical coating, is developed to measure the absorption of coated optical components. A PTDT theory is developed to describe the signal's dependence on the structural parameters of the optical coatings and on the geometric parameters of the experimental configuration. An experiment is performed to measure the PTDT signal of a highly reflective multilayer coating used in 532nm by using a probe beam with a wavelength of 632.8nm. By optimizing the incident angle of the probe beam, the measurement sensitivity is maximized. Good agreements between the theoretical predictions and experimental results are obtained.

Citation Download Citation

Honggang Hao, Bincheng Li, Mingqiang Liu, and Yuan Gong "Photothermal detuning: a sensitive technique for absorption measurement of optical thin films", Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 67201D (20 December 2007); https://doi.org/10.1117/12.758949

ACCESS THE FULL ARTICLE