Fast speed MWIR imager for uncooled focal plane array

Liu Lin

doi:10.1117/12.783115

17 November 2007 Fast speed MWIR imager for uncooled focal plane array

Liu Lin

Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 672222 (2007) https://doi.org/10.1117/12.783115
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

Recent advances of uncooled detector technology especially the development of uncooled micro-bolometer array hold promise for us to develop low-cost and compact MWIR earth observation imager. For comparative lower radiometric performance of uncooled focal plane array, fast speed optical system operating in large spectral bands is compatible. In addition, in order to exhibit advantages over imagers based on cooled detector technology, the optical system should be as compact as possible which means fewer elements, smaller size and light weight. In this article, a high speed optical design meeting these requirement is provided with 100mm focal length, F/1 F number,±2.5°field of view woking in 3-5um wave band. The fast speed MWIR imager has properties mentioned as follows: First, the optical system utilizes a hybrid system including refractive and diffractive elements. Second, the optical system realizes athermalization in simple passive way through distributing power among the refractive elements. It can work under typical temperature scope from -20°C to 60°C for typical space application. Third, Because of high speed aperture, the design makes use of aspheric surface to correct spherical aberration and spherochromatism .Finally, we use Ge and Si material. instead of expensive ZnS material.

Citation Download Citation

Liu Lin "Fast speed MWIR imager for uncooled focal plane array", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 672222 (17 November 2007); https://doi.org/10.1117/12.783115

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KEYWORDS

Zinc

Chemical elements

Imaging systems

Mid-IR

Silicon

Colorimetry

Objectives

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