Electronic trap effect of spectral sensitizing dye adsorbed on the surface of the film of silver chloride microcrystals

Xiao-Wei Li; Ji-Xian Zhang; Rong-Xiang Zhang; Wei-Dong Lai; Li Li; Xiu-Hong Dai; Guang-sheng Fu

doi:10.1117/12.783520

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14 November 2007 Electronic trap effect of spectral sensitizing dye adsorbed on the surface of the film of silver chloride microcrystals

Xiao-Wei Li, Ji-Xian Zhang, Rong-Xiang Zhang, Wei-Dong Lai, Li Li, Xiu-Hong Dai, Guang-sheng Fu

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Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 67223B (2007) https://doi.org/10.1117/12.783520
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

The photoelectron decay characteristic of AgCl mircrocrystals, which are adsorbed with the green-sensitive cyanine dye, has been obtained by using microwave absorption and phase-sensitive measurement technique. Combined with the absorption spectra of cubic AgCl emulsion sensitized by green-sensitive cyanine dye, the influence of green-sensitive cyanine dye adsorption at various adsorbing concentration on the surface structure of cubic AgCl microcrystals is investigated. It is found that when the concentration is less than 0.02ml(5.0mg/ml)/40g emulsion, the dye J-aggregate is not formed on the surface of silver chloride microcrystals, the surface of AgCl is decorated by the dye, the dye takes place shallow electron trap effect; when the sensitive concentration is more than 0.2ml (5.0mg/ml)/40g emulsion, the dye J-aggregate is formed on the surface of silver chloride microcrystals, the Agi+ of AgCl microcrystal surface is increased, the dye takes place the deep electron trap effect

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Xiao-Wei Li, Ji-Xian Zhang, Rong-Xiang Zhang, Wei-Dong Lai, Li Li, Xiu-Hong Dai, and Guang-sheng Fu "Electronic trap effect of spectral sensitizing dye adsorbed on the surface of the film of silver chloride microcrystals", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67223B (14 November 2007); https://doi.org/10.1117/12.783520

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