Paper
14 November 2007 STABCC: a new 3D surface topography algorithm based on contourlet transform and correlation theory
Jun Wang, Yan Kang, Lijun Xu
Author Affiliations +
Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 67223I (2007) https://doi.org/10.1117/12.783544
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
In machining and testing fields, 3-D surface topography evaluation is always one of the hottest study issues. Especially, in advanced integrate circuit and nanometer manufacture techniques where surface spraying and thin film plating are commonly applied for, anisotropy behavior in surface topography is rather obvious and existent 3-D surface topography evaluation is not enough in expressive force. Based on the discussing about that the advantages and disadvantages of all existent filtering methods. The contourlet Transform (CT) which may provide tight bracing and mutliscale analysis was introduced. And a new 3-D surface topography evaluation filtering algorithm is presented. This algorithm has some excellent performances such as multiscale analysis, time-frequency-localization and multidirections. Especially, the algorithm is good at describing high dimensions data. Meanwhile, on the assumption that noise comply with Gaussian distributing, according to the theory that noise is not correlated with signal, STABCC that depress noise was designed. The surface topography of a part was measured with WIVES. The data of measurement was processed by STABCC. Experiment result indicates that STABCC can reliably obtain benchmark of evaluation. And the surface information of measured part can be extracted and analyzed without distortion. Comparing with existent 3-D surface topography evaluation methods, STABCC is preponderant in practicality of engineering surface evaluation.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Wang, Yan Kang, and Lijun Xu "STABCC: a new 3D surface topography algorithm based on contourlet transform and correlation theory", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67223I (14 November 2007); https://doi.org/10.1117/12.783544
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KEYWORDS
3D image processing

Interference (communication)

Filtering (signal processing)

Image processing

Wavelets

Gaussian filters

Signal processing

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