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27 November 2007 Zernike polynomials for evaluation of optical system in use
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Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67234T (2007) https://doi.org/10.1117/12.783678
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
Affected by working condition, performance of optical system will decline, especially for large system or system in bad and complex condition. Integrated analysis can predict its performance through multi-subject engineering analysis. Thermal\structural\optical(TSO) integrated analysis is typical[1]. The key problem in TSO process is data transmission among optical, mechanical and thermal programs. Each item of Zernike polynomials has corresponding meanings with Seidel aberrations and is widely used in project, optical design software and interference checks. It is convenient and mature to use Zernike polynomials as data transmission tool between optical and structural analysis program. In TSO process, the principle, fitting method and fitting process of Zernike polynomials are outlined. This method was successfully used in some optical system's design and fabricates process.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Baozhong Shan, Baoping Guo, Hanben Niu, and Shuyan Wang "Zernike polynomials for evaluation of optical system in use", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234T (27 November 2007); https://doi.org/10.1117/12.783678
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