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17 October 2007 Active pixel sensors: the sensor of choice for future space applications?
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It is generally known that active pixel sensors (APS) have a number of advantages over CCD detectors if it comes to cost for mass production, power consumption and ease of integration. Nevertheless, most space applications still use CCD detectors because they tend to give better performance and have a successful heritage. To this respect a change may be at hand with the advent of deep sub-micron processed APS imagers (< 0.25-micron feature size). Measurements performed on test structures at the University of Delft have shown that the imagers are very radiation tolerant even if made in a standard process without the use of special design rules. Furthermore it was shown that the 1/f noise associated with deep sub-micron imagers is reduced as compared to previous generations APS imagers due to the improved quality of the gate oxides. Considering that end of life performance will have to be guaranteed, limited budget for adding shielding metal will be available for most applications and lower power operations is always seen as a positive characteristic in space applications, deep sub-micron APS imagers seem to have a number of advantages over CCD's that will probably cause them to replace CCD's in those applications where radiation tolerance and low power operation are important
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Johan Leijtens, Albert Theuwissen, Padmakumar R. Rao, Xinyang Wang, and Ning Xie "Active pixel sensors: the sensor of choice for future space applications?", Proc. SPIE 6744, Sensors, Systems, and Next-Generation Satellites XI, 67440V (17 October 2007);


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