A biphase scheme for edge detection

O. Laligant; F. Truchetet

doi:10.1117/12.752754

4 October 2007 A biphase scheme for edge detection

O. Laligant, F. Truchetet

Proceedings Volume 6763, Wavelet Applications in Industrial Processing V; 67630Z (2007) https://doi.org/10.1117/12.752754
Event: Optics East, 2007, Boston, MA, United States

Abstract

A new simple and efficient scheme for edge detection is presented. Its first property is to localize correctly edges in sharp images. The ability of the method to strongly reduce any noise is demonstrated. Its performances are also established in the case of the gaussian white noise. The multiresolution version of this method is introduced: it will be developed in a future work.

Citation Download Citation

O. Laligant and F. Truchetet "A biphase scheme for edge detection", Proc. SPIE 6763, Wavelet Applications in Industrial Processing V, 67630Z (4 October 2007); https://doi.org/10.1117/12.752754

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