Translator Disclaimer
Paper
23 March 1987 Real-Time Snapshot Interferometer
Author Affiliations +
Abstract
A compact, no-moving-parts, dc-phase-measuring interferometer has been designed and manufactured. This interferometer was designed to provide high-density sampling, high-accuracy wavefront measurements under adverse conditions. A crossed grating shearing interferometer technique has been utilized where all data is simultaneously collected on a single fixed detector array. This highly stable configuration provides a means of obtaining phase information using cw, shuttered (1 to 10-3 sec), or ultra-short-pulsed sources. This self-contained instrument can be used to take large numbers of interferograms quickly and reduce their data efficiently to obtain wavefront constructions.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph L McLaughlin and Bruce A Horwitz "Real-Time Snapshot Interferometer", Proc. SPIE 0680, Surface Characterization and Testing, (23 March 1987); https://doi.org/10.1117/12.939589
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Testing of aspheric surfaces
Proceedings of SPIE (November 09 2001)
Wyko Systems For Optical Metrology
Proceedings of SPIE (March 23 1987)

Back to Top