Application Of Synchrotron Radiation To X-Ray Fluorescence Analysis Of Trace Elements

B M Gordon; K W Jones; A L Hanson

doi:10.1117/12.939624

9 March 1987 Application Of Synchrotron Radiation To X-Ray Fluorescence Analysis Of Trace Elements

B M Gordon, K W Jones, A L Hanson

Proceedings Volume 0681, Laser and Nonlinear Optical Materials; (1987) https://doi.org/10.1117/12.939624
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

The development of synchrotron radiation x-ray sources has provided the means to greatly extend the capabilities of x-ray fluorescence analysis for determinations of trace element concentrations. A brief description of synchrotron radiation properties provides a background for a discussion of the improved detection limits compared to existing x-ray fluorescence techniques. Calculated detection limits for x-ray microprobes with micrometer spatial resolutions are described and compared with experimental results beginning to appear from a number of laboratories. The current activities and future plans for a dedicated x-ray microprobe beam line at the National Synchrotron Light Source (NSLS) of Brookhaven National Laboratory are presented.

Citation Download Citation

B M Gordon, K W Jones, and A L Hanson "Application Of Synchrotron Radiation To X-Ray Fluorescence Analysis Of Trace Elements", Proc. SPIE 0681, Laser and Nonlinear Optical Materials, (9 March 1987); https://doi.org/10.1117/12.939624

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