Beam deflection measurement using Moire effect and Talbot interferometer

Z. Y. Chen; S. H. Leung; P. S. Chung

doi:10.1117/12.758176

4 January 2008 Beam deflection measurement using Moire deflectometry and Talbot interferometry

Z. Y. Chen, S. H. Leung, P. S. Chung

Proceedings Volume 6832, Holography and Diffractive Optics III; 68321A (2008) https://doi.org/10.1117/12.758176
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

This paper introduces a new and simple concept of moire effect. A circular grating placed at Talbot planes can achieve beam deflection measurement in real time. It is not only used for 2-D beam shift measurement at every point, but also used to measure the angle and plane parallel degree of optical element and birefringence measurement of the optical material.

Citation Download Citation

Z. Y. Chen, S. H. Leung, and P. S. Chung "Beam deflection measurement using Moire deflectometry and Talbot interferometry", Proc. SPIE 6832, Holography and Diffractive Optics III, 68321A (4 January 2008); https://doi.org/10.1117/12.758176

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