A specially designed optical system for measurement of the characteristic of square super-lattice pattern in DBD

Haitao Zhao; Lifang Dong; Weixia Xie; Weili Fan

doi:10.1117/12.756910

21 January 2008 A specially designed optical system for measurement of the characteristic of square super-lattice pattern in DBD

Haitao Zhao, Lifang Dong, Weixia Xie, Weili Fan

Author Affiliations +

Proceedings Volume 6834, Optical Design and Testing III; 683432 (2008) https://doi.org/10.1117/12.756910
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

In this work, a special designed optical system is used to measure the characteristic of square super-lattice pattern in DBD system. A dielectric barrier discharge system with two liquid electrodes is used, which has a lot of advantages and convenience to the experiment. A square super-lattice pattern is observed in the system at appropriate experimental parameters. The patterns follow as random filaments, square pattern, quasi-super-lattice pattern, square super-lattice pattern, stripe pattern and hexagonal pattern when the applied voltage increases. The influence of the gas pressure p, the gas gap width d, and the pd value (the product of gas pressure p and the gas gap width d) on the square super-lattice pattern are investigated. There are some changes of the pattern scenario when the experimental parameters changes. It is found that the voltage of the square super-lattice pattern increases slightly as d increases. In addition, it is found that the voltage of the square super-lattice pattern decreases as the gas pressure decreases. The square super-lattice pattern can be observed stable and regular at atmosphere pressure when 1.36mm < d < 2.2mm, and the gas pressure is reduced less than atmosphere pressure to obtain the square super-lattice pattern if d >2.2mm.

Citation Download Citation

Haitao Zhao, Lifang Dong, Weixia Xie, and Weili Fan "A specially designed optical system for measurement of the characteristic of square super-lattice pattern in DBD", Proc. SPIE 6834, Optical Design and Testing III, 683432 (21 January 2008); https://doi.org/10.1117/12.756910

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available