Paper
4 January 2008 Effect of indium tin oxide (ITO) current spreading layer on the current uniformity of vertical structure GaN-based light-emitting diodes
Zhiqiang Liu, Debo Guo, Xiaoyan Yi, Yu Chen, Libin Wang, Liangchen Wang, Guohang Wang
Author Affiliations +
Abstract
Compared with conventional GaN based LEDs structure, vertical electrodes structure can improve the current uniformity to some extend. However, due to the presence of N-GaN series resistance, current crowing phenomenon still exist at the electrode edge of vertical structure GaN-based LEDs. The most common solutions to overcome these problems consist in using transparent current spreading contact layer, generally made of indium tin oxide (ITO). In this paper, the effect of indium tin oxide (ITO) layer on the current uniformity and the current distribution are analyzed by theoretical calculation. At last, vertical structure GaN-based LEDs was fabricated and the electrical character was measured. Experiment result exhibits good agreement with the theoretical calculation.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhiqiang Liu, Debo Guo, Xiaoyan Yi, Yu Chen, Libin Wang, Liangchen Wang, and Guohang Wang "Effect of indium tin oxide (ITO) current spreading layer on the current uniformity of vertical structure GaN-based light-emitting diodes", Proc. SPIE 6841, Solid State Lighting and Solar Energy Technologies, 68410N (4 January 2008); https://doi.org/10.1117/12.760221
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Cited by 2 scholarly publications.
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KEYWORDS
Light emitting diodes

Resistance

Indium

Tin

Oxides

Gallium nitride

Electrodes

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