High-efficiency, high-power diode laser chips, bars, and stacks

Hanxuan Li; Frank Reinhardt; Irving Chyr; Xu Jin; Kiran Kuppuswamy; Terry Towe; Denny Brown; Oscar Romero; Daming Liu; Robert Miller; Touyen Nguyen; Trevor Crum; Tom Truchan; Ed Wolak; Jeff Mott; James Harrison

doi:10.1117/12.763945

13 February 2008 High-efficiency, high-power diode laser chips, bars, and stacks

Hanxuan Li, Frank Reinhardt, Irving Chyr, Xu Jin, Kiran Kuppuswamy, Terry Towe, Denny Brown, Oscar Romero, Daming Liu, Robert Miller, Touyen Nguyen, Trevor Crum, Tom Truchan, Ed Wolak, Jeff Mott, James Harrison

Author Affiliations +

Proceedings Volume 6876, High-Power Diode Laser Technology and Applications VI; 68760G (2008) https://doi.org/10.1117/12.763945
Event: Lasers and Applications in Science and Engineering, 2008, San Jose, California, United States

Abstract

Leveraging improvements to device structures and cooling technologies, ultra-high-power bars have been integrated into multi-bar stacks to obtain CW power densities in excess of 2.8 kW/cm² near 960 nm with spectral widths of <4nm FWHM. These characteristics promise to enable cost-effective solutions for a variety of applications that demand very high spatial and/or spectral brightness. Using updated device designs, mini-bar variants have been employed to derive CW powers of several tens of Watts near 940 nm on traditional single-emitter platforms. For example, >37 W CW have been obtained from 5-emitter devices on standard CuW CT heatsinks with AuSn solder. Near 808 nm, a PCE of 65% with a slope efficiency of 1.29 W/A has been demonstrated with a 20%-fill-factor, 2-mm-cavity-length bar.

Citation Download Citation

Hanxuan Li, Frank Reinhardt, Irving Chyr, Xu Jin, Kiran Kuppuswamy, Terry Towe, Denny Brown, Oscar Romero, Daming Liu, Robert Miller, Touyen Nguyen, Trevor Crum, Tom Truchan, Ed Wolak, Jeff Mott, and James Harrison "High-efficiency, high-power diode laser chips, bars, and stacks", Proc. SPIE 6876, High-Power Diode Laser Technology and Applications VI, 68760G (13 February 2008); https://doi.org/10.1117/12.763945

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