Paper
6 February 2008 Design of axially super-resolving phase pupil filter for high-numerical aperture applications
Toufic G. Jabbour, Stephen M. Kuebler
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Abstract
The method of generalized projection was used to design a phase pupil filter that super-resolves the axial point-spread-function (PSF) by 29% while holding the side-lobe intensities at below 52% of the peak intensity in the non-paraxial regime. The resulting phase filter has a binary 0/π eleven-zone rotationally symmetric profile. Although the filter's performance is theoretically satisfactory, it can be greatly compromised by imperfections introduced during experimental implementation. Such imperfections include fabrication errors, surface quality variation, and optical misalignment. A model based on vectorial diffraction was used to simulate and analyze quantitatively the effect of these imperfections on the superresolved PSF.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toufic G. Jabbour and Stephen M. Kuebler "Design of axially super-resolving phase pupil filter for high-numerical aperture applications", Proc. SPIE 6883, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics, 688310 (6 February 2008); https://doi.org/10.1117/12.761022
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Cited by 1 scholarly publication.
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KEYWORDS
Diffractive optical elements

Diffraction

Point spread functions

Etching

Super resolution

Binary data

Tolerancing

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