Surface Structure Analysis Using Grazing Incidence X-ray Scattering

S. Brennan

doi:10.1117/12.936608

12 August 1986 Surface Structure Analysis Using Grazing Incidence X-ray Scattering

S. Brennan

Proceedings Volume 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments; (1986) https://doi.org/10.1117/12.936608
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A description of the Grazing Incidence X-ray Scattering technique is presented including examples of the wide variety of work being performed in the areas of ordered overlayer structure determination, phase transition studies of ordered overlayers and structural studies of thin amorphous films.

Citation Download Citation

S. Brennan "Surface Structure Analysis Using Grazing Incidence X-ray Scattering", Proc. SPIE 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments, (12 August 1986); https://doi.org/10.1117/12.936608

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