Translator Disclaimer
19 February 2008 Electron microscopy and spectroscopy of thinfilms for spectral storage
Author Affiliations +
Rare earth doped thin-films have been produced using laser pulse vapor deposition technique. By changing the thin film growth environment inside the chamber, we were able to create several optical centers. Emission and absorption spectroscopy measurements performed on these structures confirm that that these thinfilms are suitable candidates to be used for ultra-high density spectral storage applications. Scanning electron microscopy studies of these thinfilms were conducted to study degradation in their optical quality upon long-term storage. Results on microscopy show that the deterioration is initiated by nano-gaps and cracks in the capping layer of zinc sulfide.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Bezares and Zameer Hasan "Electron microscopy and spectroscopy of thinfilms for spectral storage", Proc. SPIE 6903, Advanced Optical Concepts in Quantum Computing, Memory, and Communication, 690307 (19 February 2008);

Back to Top