Paper
29 January 2008 Interband cascade laser progress
W. W. Bewley, C. L. Canedy, M. Kim, C. S. Kim, J. A. Nolde, D. C. Larrabee, J. R. Lindle, I. Vurgaftman, J. R. Meyer
Author Affiliations +
Abstract
Recent advances in the development of mid-IR antimonide type-II "W" interband cascade lasers have led to a considerably improved high-temperature operation of the devices. We report an experimental investigation of four interband cascade lasers with wavelengths spanning the mid-infrared spectral range, i.e., 2.9-5.2 μm near room temperature in pulsed mode. One broad-area device had a pulsed threshold current density of only 3.8 A/cm at 78 K (λ = 3.6 μm) and 590 A/cm2 at 300 K (λ = 4.1 μm). The room-temperature threshold for the shortest-wavelength device (λ = 2.6-2.9 μm) was even lower, 450 A/cm2. A cavity-length study of the lasers emitting at 3.6-4.1 μm yielded an internal loss varying from 7.8 cm-1 at 78 K to 24 cm-1 at 300 K, accompanied by a decrease of the internal efficiency from 77% to 45%. Preliminary cw testing led to a narrow-ridge device from one of the wafers with emission at λ = 4.1 μm operating to 288 K, a new record for interband devices in this wavelength range.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. W. Bewley, C. L. Canedy, M. Kim, C. S. Kim, J. A. Nolde, D. C. Larrabee, J. R. Lindle, I. Vurgaftman, and J. R. Meyer "Interband cascade laser progress", Proc. SPIE 6909, Novel In-Plane Semiconductor Lasers VII, 69090X (29 January 2008); https://doi.org/10.1117/12.766908
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Semiconducting wafers

Quantum cascade lasers

Semiconductor lasers

Mid-IR

Temperature metrology

Continuous wave operation

Light emitting diodes

Back to Top