X-ray Microtomography with Synchrotron Radiation

D. K. Bowen; J. S. Elliott; S. R. Stock; S. D. Dover

doi:10.1117/12.936625

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12 August 1986 X-ray Microtomography with Synchrotron Radiation

D. K. Bowen, J. S. Elliott, S. R. Stock, S. D. Dover

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Proceedings Volume 0691, X-Ray Imaging II; (1986) https://doi.org/10.1117/12.936625
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

High resolution x-ray microtomography has been established at the synchrotron radiation source at Daresbury Laboratory, U.K. A high precision mechanical stage with two translational and one rotational degree of freedom has been constructed, and fully characterised by mechanical metrology; overall precision is better than 0.5 μm. Collimation of the incident synchrotron radiation beam through a 4 pm aperture has been obtained, giving 2 μm overall spatial resolution. Results have been obtained using monochromatic radiation at both 1 angstrom and 0.37 angstrom wavelengths, on human bone fragments and on sintered alumina ceramics.

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D. K. Bowen, J. S. Elliott, S. R. Stock, and S. D. Dover "X-ray Microtomography with Synchrotron Radiation", Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); https://doi.org/10.1117/12.936625

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