Third generation infrared system calibration using dual band thermoelectric thermal reference sources and test systems to calibrate uncooled IRFPAs

David K. Finfrock; William L. Kolander

doi:10.1117/12.782057

15 April 2008 Third generation infrared system calibration using dual band thermoelectric thermal reference sources and test systems to calibrate uncooled IRFPAs

David K. Finfrock, William L. Kolander

Author Affiliations +

Proceedings Volume 6940, Infrared Technology and Applications XXXIV; 69400V (2008) https://doi.org/10.1117/12.782057
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States

Abstract

As dual band, 3rd generation FLIR systems progress from the research lab into the field, supporting technologies must also advance. This paper describes advances in Thermoelectric Thermal Reference Sources (TTRS) from single band (3 to 5 or 8 to 12 microns) to dual band in one assembly (3 to 5 and 8 to 12 microns). It will describe the optical, system, electrical, and mechanical parameters of dual band TTRS units. It provides IR system design engineers with the critical parameters of dual band TTRS units to aid in their design process. TTRS assemblies provide a temperature controllable radiometrically uniform surface. When viewed by theFLIR system detectors, the TTRS enables the system electronics to perform gain and offset calibration as well as DC restoration for each pixel's preamp Some of the parameters for 3rd Generation FLIR system TTRS units included in this paper will be: Emissivity of BB surfaces. Apparent thermal radiometric uniformity. How this is predicted and measured. Window material wavelength transmission (Hermetically sealed units only). TTRS emitter surface temperatures as a function of heat sink temperatures. Trade-off between uniformity, power consumption, and transient performance. Power consumption, Thermal interfaces and required heat sinking Types and accuracy of Temperature sensors mounted on emitter surface. Also included in this paper is a description of a Thermoelectric Black Body Test Apparatus that can be used to generate temperature coefficients needed to "burn" Proms for uncooled IRFPAs during their production and burn in processing.

Citation Download Citation

David K. Finfrock and William L. Kolander "Third generation infrared system calibration using dual band thermoelectric thermal reference sources and test systems to calibrate uncooled IRFPAs", Proc. SPIE 6940, Infrared Technology and Applications XXXIV, 69400V (15 April 2008); https://doi.org/10.1117/12.782057

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available