Optical Component Inspection For Data Storage Applications

Ad Oudenhuysen; Wai-Hon Lee

doi:10.1117/12.936839

14 January 1987 Optical Component Inspection For Data Storage Applications

Ad Oudenhuysen, Wai-Hon Lee

Proceedings Volume 0695, Optical Mass Data Storage II; (1987) https://doi.org/10.1117/12.936839
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

The performance of optical disk drives is dependent on the quality of the optical components used in the read/write head. In this paper we discuss the effects of wavefront aberrations on the tracking and focusing servo signals. A heterodyne grating shearing interferometer which can measure the performance of the optical components in the drive environment is then described. Experimental results related to this interferometer is also presented.

Citation Download Citation

Ad Oudenhuysen and Wai-Hon Lee "Optical Component Inspection For Data Storage Applications", Proc. SPIE 0695, Optical Mass Data Storage II, (14 January 1987); https://doi.org/10.1117/12.936839

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