Paper
11 April 2008 Support vector machines in hyperspectral imaging spectroscopy with application to material identification
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Abstract
A processing methodology based on Support Vector Machines is presented in this paper for the classification of hyperspectral spectroscopic images. The accurate classification of the images is used to perform on-line material identification in industrial environments. Each hyperspectral image consists of the diffuse reflectance of the material under study along all the points of a line of vision. These images are measured through the employment of two imaging spectrographs operating at Vis-NIR, from 400 to 1000 nm, and NIR, from 1000 to 2400 nm, ranges of the spectrum, respectively. The aim of this work is to demonstrate the robustness of Support Vector Machines to recognise certain spectral features of the target. Furthermore, research has been made to find the adequate SVM configuration for this hyperspectral application. In this way, anomaly detection and material identification can be efficiently performed. A classifier with a combination of a Gaussian Kernel and a non linear Principal Component Analysis, namely k-PCA is concluded as the best option in this particular case. Finally, experimental tests have been carried out with materials typical of the tobacco industry (tobacco leaves mixed with unwanted spurious materials, such as leathers, plastics, etc.) to demonstrate the suitability of the proposed technique.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Beatriz Garcia-Allende, Francisco Anabitarte, Olga M. Conde, Jesus Mirapeix, Francisco J. Madruga, and Jose M. Lopez-Higuera "Support vector machines in hyperspectral imaging spectroscopy with application to material identification", Proc. SPIE 6966, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XIV, 69661V (11 April 2008); https://doi.org/10.1117/12.770306
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Cited by 7 scholarly publications.
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KEYWORDS
Hyperspectral imaging

Near infrared

Principal component analysis

Imaging spectroscopy

Calibration

Image classification

Imaging systems

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