Paper
11 March 2008 Study of Si/SiO2 hybrid antireflective coatings on SLD prepared by DSEBET
M. X. Sun, M. Q. Tan, M. Zhao
Author Affiliations +
Proceedings Volume 6984, Sixth International Conference on Thin Film Physics and Applications; 69842P (2008) https://doi.org/10.1117/12.792269
Event: Sixth International Conference on Thin Film Physics and Applications, 2007, Shanghai, China
Abstract
We introduce a double source electron beam evaporation (DSEBET) technique in this paper. The refractive index coatings were fabricated on K9 glass substrate by adjusting the evaporation rates of two independent sources. The coatings, which were described by atomic force microscopy (AFM), show good compactness and homogeneity. The antireflective (AR) coatings were fabricated on Superluminescent Diodes (SLD) by DSEBET. The hybrid AR coatings on the facets of SLD were prepared in evaporation rates of 0.22nm/s and 0.75nm/s for silicon and silicon dioxide, respectively. The results of AFM and spectral performance of coated SLD show that DSEBET has a promising future in preparing the coatings on optoelectronic devices.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. X. Sun, M. Q. Tan, and M. Zhao "Study of Si/SiO2 hybrid antireflective coatings on SLD prepared by DSEBET", Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 69842P (11 March 2008); https://doi.org/10.1117/12.792269
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KEYWORDS
Antireflective coatings

Refractive index

Silica

Silicon

Electron beams

Optical coatings

Modulation

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