You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
14 May 2008IC-compatible microspectrometer using a planar imaging diffraction grating
The design and performance of a highly miniaturized spectrometer fabricated using MEMS technologies are reported in
this paper. Operation is based on an imaging diffraction grating. Minimizing fabrication complexity and assembly of the
micromachined optical and electronic parts of the microspectrometer implies a planar design. It consists of two parallel
glass plates, which contain all spectrograph components, including slit and diffraction grating, and can be fabricated on a
single glass wafer with standard lithography. A simple analytical model for determining spectral resolution from device
dimensions was developed and used for finding the optimal parameters of a miniaturized spectrometer as a compromise
between size and spectral resolution. The fabricated spectrometer is very compact (11 × 1.5 × 3 mm3), which allowed
mounting directly on top of an image sensor. The realized spectrometer features a 6 nm spectral resolution over a 100 nm
operating range from 600 nm to 700 nm, which was tested using a Ne light source.
The alert did not successfully save. Please try again later.
S. Grabarnik, A. Emadi, H. Wu, G. De Graaf, G. Vdovin, R. F. Wolffenbuttel, "IC-compatible microspectrometer using a planar imaging diffraction grating," Proc. SPIE 6992, Micro-Optics 2008, 699215 (14 May 2008); https://doi.org/10.1117/12.781103