You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
5 May 2008The optical near-field of randomly textured light trapping structures for thin-film solar cells
Randomly textured zinc oxide surfaces with and without amorphous silicon deposited on top are studied by near-field
scanning optical microscopy. By virtue of a three dimensions it allows to access the local light intensity in the entire
spatial domain above the structures. Measurements are compared with large scale finite-difference time-domain
simulations. This study provides new insight into light trapping in thin-film silicon solar cells on a nanoscopic scale.
Light localization on the surface of the textured interface and a focusing of light by the structure further away are
observed as the key features characteristic for such surfaces.
The alert did not successfully save. Please try again later.
T. Beckers, K. Bittkau, C. Rockstuhl, S. Fahr, F. Lederer, R. Carius, "The optical near-field of randomly textured light trapping structures for thin-film solar cells," Proc. SPIE 7002, Photonics for Solar Energy Systems II, 70020D (5 May 2008); https://doi.org/10.1117/12.781121