Paper
22 April 2008 Coincidental multiple x-ray diffraction as tool for precise investigation of crystals
M. Borcha, I. Fodchuk, O. Kroitor, Ya. Garabazhiv, O. Kshevetsky
Author Affiliations +
Proceedings Volume 7008, Eighth International Conference on Correlation Optics; 700819 (2008) https://doi.org/10.1117/12.797221
Event: Eighth International Conference on Correlation Optics, 2007, Chernivsti, Ukraine
Abstract
The precision of lattice parameter determination can be significantly risen providing superposition of closely set maxima at Renninger-scan, which are in addition structure and spectral sensitive. This superposition can be achieved by means of lattice parameters change or wavelenght variation. We have realized that in the cases of coincidental coplanar or noncoplanar multiple x-ray diffraction. We have studied evolution of an angular distance between diffraction maxima near the range of coincidental multiple x-ray diffraction depending on stochiometric composition and temperature of sample. It has been shown that sensitivity of multiple diffraction is Δφ/Δa≈13.3 sec of arc /10-6 Å in the region of coincidental coplanar or noncoplanar x-ray diffraction.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Borcha, I. Fodchuk, O. Kroitor, Ya. Garabazhiv, and O. Kshevetsky "Coincidental multiple x-ray diffraction as tool for precise investigation of crystals", Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 700819 (22 April 2008); https://doi.org/10.1117/12.797221
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffraction

Crystals

X-ray diffraction

Superposition

X-rays

Optical spheres

Laser crystals

Back to Top