Paper
5 June 2008 Subnanometer characterization of large aperture optical components using broad-band interferometry
A. M. Sergeev, E. A. Khazanov, I. E. Kozhevatov, D. E. Silin
Author Affiliations +
Proceedings Volume 7022, Advanced Laser Technologies 2007; 70220I (2008) https://doi.org/10.1117/12.803935
Event: Advanced Laser Technologies 2007, 2007, Levi, Finland
Abstract
A new method of high order broad-band optical interferometry is presented. The core concept is to use surface control of broad-band radiation with a complex, specially prepared spectrum. High order broad-band interferometers have several merits: selectivity along the line of sight, high noise immunity (and correspondingly high accuracy) and the possibility of carrying out precise measurements without mechanically moving the reference or test plates. These interferometers permit control of large aperture optical elements (including remote control) with nanometer and even subnanometer accuracy. Some application examples of high order broad-band interferometry are demonstrated.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. M. Sergeev, E. A. Khazanov, I. E. Kozhevatov, and D. E. Silin "Subnanometer characterization of large aperture optical components using broad-band interferometry", Proc. SPIE 7022, Advanced Laser Technologies 2007, 70220I (5 June 2008); https://doi.org/10.1117/12.803935
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KEYWORDS
Interferometers

Optical components

Interferometry

Mirrors

Beam splitters

Control systems

Optical filters

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