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10 September 2008 Analysis of silver columnar thin films by atomic force microscopy
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Abstract
Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.
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Fatima Benkabou and Akhlesh Lakhtakia "Analysis of silver columnar thin films by atomic force microscopy", Proc. SPIE 7041, Nanostructured Thin Films, 704112 (10 September 2008); https://doi.org/10.1117/12.796212
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