Spatially phase-shifted digital speckle pattern interferometry (SPS-DSPI) and cryogenic structures: recent improvements

Peter Blake; Perry Greenfield; Warren Hack; J. Todd Miller; Ivo Busko; Babak Saif; Bente Eegholm; Ritva Keski-Kuha; Marcel Bluth

doi:10.1117/12.797467

11 August 2008 Spatially phase-shifted digital speckle pattern interferometry (SPS-DSPI) and cryogenic structures: recent improvements

Peter Blake, Perry Greenfield, Warren Hack, J. Todd Miller, Ivo Busko, Babak Saif, Bente Eegholm, Ritva Keski-Kuha, Marcel Bluth

Author Affiliations +

Proceedings Volume 7063, Interferometry XIV: Techniques and Analysis; 706306 (2008) https://doi.org/10.1117/12.797467
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

The Spatially Phase Shifted Digital Speckle Pattern Interferometer (SPS-DSPI) is a speckle pattern interferometer in which the four phase-shifted interferograms are captured simultaneously in a single image. Designed to measure thermal distortions of large matte-surfaced structures for the James Webb Space Telescope (JWST) program, this metrology instrument has been used in two major cryo-distortion tests. This report will describe how differences in the vibrational motions of the test objects necessitated changes in basic algorithms. The authors also report operational upgrades, quantification of uncertainty, and improvement of the software operability with a graphic interface. Results from the tests of the JWST test structures are discussed as illustration.

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Peter Blake, Perry Greenfield, Warren Hack, J. Todd Miller, Ivo Busko, Babak Saif, Bente Eegholm, Ritva Keski-Kuha, and Marcel Bluth "Spatially phase-shifted digital speckle pattern interferometry (SPS-DSPI) and cryogenic structures: recent improvements", Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 706306 (11 August 2008); https://doi.org/10.1117/12.797467

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