Standardization of noncontact 3D measurement

Toshiyuki Takatsuji; Sonko Osawa; Osamu Sato

doi:10.1117/12.797968

29 August 2008 Standardization of noncontact 3D measurement

Toshiyuki Takatsuji, Sonko Osawa, Osamu Sato

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Proceedings Volume 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI; 706602 (2008) https://doi.org/10.1117/12.797968
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

As the global R&D competition is intensified, more speedy measurement instruments are required both in laboratories and production process. In machinery areas, while contact type coordinate measuring machines (CMM) have been widely used, noncontact type CMMs are growing its market share which are capable of measuring enormous number of points at once. Nevertheless, since no industrial standard concerning an accuracy test of noncontact CMMs exists, each manufacturer writes the accuracy of their product according to their own rules, and this situation gives confusion to customers. The working group ISO/TC 213/WG 10 is trying to make a new ISO standard which stipulates an accuracy test of noncontact CMMs. The concept and the situation of discussion of this new standard will be explained. In National Metrology Institute of Japan (NMIJ), we are collecting measurement data which serves as a technical background of the standards together with a consortium formed by users and manufactures. This activity will also be presented.

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Toshiyuki Takatsuji, Sonko Osawa, and Osamu Sato "Standardization of noncontact 3D measurement", Proc. SPIE 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI, 706602 (29 August 2008); https://doi.org/10.1117/12.797968

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