Estimating surface roughness using image focus

Aamir Saeed Malik; Tae-Sun Choi

doi:10.1117/12.798182

15 September 2008 Estimating surface roughness using image focus

Aamir Saeed Malik, Tae-Sun Choi

Proceedings Volume 7073, Applications of Digital Image Processing XXXI; 70731Z (2008) https://doi.org/10.1117/12.798182
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Estimation of surface roughness is an important parameter for many applications including optics, polymers, semiconductor etc. In this paper, we propose to estimate surface roughness using one of the 3D shape recovery optical passive methods, i.e., shape from focus. Three-dimensional shape recovery from one or multiple observations is a challenging problem of computer vision. The objective of shape from focus is to calculate the depth map. That depth map can further be used in techniques and algorithms leading to recovery of three dimensional structure of object which is required in many high level vision applications. The same depth map can also be used for surface roughness estimation. One of the requirements, of researchers is to quickly compare the samples being fabricated based on various measures including surface roughness. However, the high cost involved in estimation of surface roughness limits its extensive and exhaustive usage. Therefore, we propose an inexpensive and fast method based on Shape From Focus (SFF). We use two microscopic test objects, i.e., coin and TFT-LCD cell for estimating the surface roughness.

Citation Download Citation

Aamir Saeed Malik and Tae-Sun Choi "Estimating surface roughness using image focus", Proc. SPIE 7073, Applications of Digital Image Processing XXXI, 70731Z (15 September 2008); https://doi.org/10.1117/12.798182

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KEYWORDS

Surface roughness

3D image processing

Computer programming

Cameras

Head

Image acquisition

Imaging systems

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