Diffraction imaging with conventional sources

Wei Zhou; C. A. MacDonald

doi:10.1117/12.795383

22 September 2008 Diffraction imaging with conventional sources

Wei Zhou, C. A. MacDonald

Proceedings Volume 7077, Advances in X-Ray/EUV Optics and Components III; 70770K (2008) https://doi.org/10.1117/12.795383
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

X ray diffraction reveals the nanoscale structure of both tissue and inorganic materials. Different materials can be distinguished and mapped by collecting the diffracted rays at different angles. Conventional diffraction measurements require a pencil beam and hence a small sample area to measure an accurate diffraction angle, so producing a mapped image requires a two dimensional scan. In order to to shorten the collection time for large areas, a slit system was developed. An antiscatter grid was placed in front of the detector to select the desired diffraction angle. This device can potentially be used in a scanning system to map the presence of target materials or in diagnostic radiology to detect cancerous tissues.

Citation Download Citation

Wei Zhou and C. A. MacDonald "Diffraction imaging with conventional sources", Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70770K (22 September 2008); https://doi.org/10.1117/12.795383

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