Calibration of MCP transmissivity from 2-5.5keV

Zhu-rong Cao; Hang Li; Jian-jun Dong; Shun-chao Wu; Rong-qing Yi

doi:10.1117/12.796376

3 September 2008 Calibration of MCP transmissivity from 2-5.5keV

Zhu-rong Cao, Hang Li, Jian-jun Dong, Shun-chao Wu, Rong-qing Yi

Proceedings Volume 7077, Advances in X-Ray/EUV Optics and Components III; 70771M (2008) https://doi.org/10.1117/12.796376
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

A micro-channel plate (MCP) transmissivity is calibrated using the 3B3 medium energy X-ray beamline (from 2.0 to 5.5keV) on Beijing Synchrotron Radiation Facility (BSRF). MCP transmissivity near the two ends of low-energy 2.0keV and high-energy 5.5keV is higher than the middle part. We calculate reflectivity and transmission in the pores array of MCP respectively, and take the experiment result into account synthetically. It uncovers that the grazing incident X-ray in pores results in the total reflection, and the reflectivity rises as the X-ray energy decreases, which successfully explains the peculiar phenomena of the high transmissivity in low energy.

Citation Download Citation

Zhu-rong Cao, Hang Li, Jian-jun Dong, Shun-chao Wu, and Rong-qing Yi "Calibration of MCP transmissivity from 2-5.5keV", Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70771M (3 September 2008); https://doi.org/10.1117/12.796376

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