Effect of chemical etching on the surface roughness of CdZnTe and CdMnTe gamma radiation detectors

A. Hossain; S. Babalola; A. E. Bolotnikov; G. S. Camarda; Y. Cui; G. Yang; M. Guo; D. Kochanowska; A. Mycielski; A. Burger; R. B. James

doi:10.1117/12.796797

4 September 2008 Effect of chemical etching on the surface roughness of CdZnTe and CdMnTe gamma radiation detectors

A. Hossain, S. Babalola, A. E. Bolotnikov, G. S. Camarda, Y. Cui, G. Yang, M. Guo, D. Kochanowska, A. Mycielski, A. Burger, R. B. James

Author Affiliations +

Proceedings Volume 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X; 70791E (2008) https://doi.org/10.1117/12.796797
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Generally, mechanical polishing is performed to diminish the cutting damage followed by chemical etching to remove the remaining damage on crystal surfaces. In this paper, we detail the findings from our study of the effects of various chemical treatments on the roughness of crystal surfaces. We prepared several CdZnTe (CZT) and CdMnTe (CMT) crystals by mechanical polishing with 5 μm and/or lower grits of Al₂O₃ abrasive papers including final polishing with 0.05-μm particle size alumina powder and then etched them for different periods with a 2%, 5% Bromine-Methanol (B-M) solution, and also with an E-solution (HNO₃:H₂0:K₂Cr₂O₇). The material removal rate (etching rate) from the crystals was found to be 10 μm, 30 μm, and 15 μm per minute, respectively. The roughness of the resulting surfaces was determined by the Atomic Force Microscopy (AFM) to identify the most efficient surface processing method by combining mechanical and chemical polishing.

Citation Download Citation

A. Hossain, S. Babalola, A. E. Bolotnikov, G. S. Camarda, Y. Cui, G. Yang, M. Guo, D. Kochanowska, A. Mycielski, A. Burger, and R. B. James "Effect of chemical etching on the surface roughness of CdZnTe and CdMnTe gamma radiation detectors", Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 70791E (4 September 2008); https://doi.org/10.1117/12.796797

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available