Paper
3 September 2008 A mammography imaging hybrid pixel sensor test chip with low-noise CMOS readout IC on fully depleted silicon-on-insulator design
D. Nguyen, H. Cormican, A. Baysal, C. Wiswall, T. Kerr, J. M. Wang, D. Ma
Author Affiliations +
Abstract
This paper reports the design trade off study of the design of an innovative CMOS active pixel sensor (CAPS) based on Silicon-on-Insulator (SOI) technology. The CAPS designs approach provides the flexibility and high-density features of hybrid pixel sensors with photon counting architecture. This sensor is the key component for optimized X-ray Tomosynthesis. A proof-ofprinciple test chip, paying particular attention to the noise performance of the pixel, front-end electronics (FEE) and readout speed, is available for testing in 2008. We present the design of the test chip in this paper.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Nguyen, H. Cormican, A. Baysal, C. Wiswall, T. Kerr, J. M. Wang, and D. Ma "A mammography imaging hybrid pixel sensor test chip with low-noise CMOS readout IC on fully depleted silicon-on-insulator design", Proc. SPIE 7080, Penetrating Radiation Systems and Applications IX, 708009 (3 September 2008); https://doi.org/10.1117/12.792554
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Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Photon counting

Mammography

Silicon

CMOS sensors

Electronics

Breast

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