An x-ray fluorescence (XRF) computed tomography (CT) system utilizing a cadmium telluride (CdTe) detector is
described. The CT system is of the first generation type and consists of a cerium x-ray generator, a turn table, a
translation stage, a two-stage controller, a CdTe spectrometer, a multichannel analyzer (MCA), a counter board (CB),
and a personal computer (PC). When an object is exposed by the x-ray generator, iodine K-series fluorescences are
produced and are detected from vertical direction to x-ray axis using the spectrometer. Fluorescent photons are selected
out using the MCA and are counted by the PC via CB, and XRF CT is performed by repeating translation and rotation
of an object.
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