Broadband polarization compensation in silicon-on-insulator components using cladding stress engineering

Dan-Xia Xu; André Delâge; Siegfried Janz; Pavel Cheben

doi:10.1117/12.807478

12 August 2008 Broadband polarization compensation in silicon-on-insulator components using cladding stress engineering

Dan-Xia Xu, André Delâge, Siegfried Janz, Pavel Cheben

Proceedings Volume 7099, Photonics North 2008; 70991O (2008) https://doi.org/10.1117/12.807478
Event: Photonics North 2008, 2008, Montréal, Canada

Abstract

We review the applications of cladding stress induced birefringence for controlling the polarization dependent properties in SOI waveguide components. In particular, we discuss the phase index and group index birefringence and their dispersion in this high index contrast waveguide platform, and the influence of waveguide cross-section geometry and cladding stress on these properties. Design of broadband polarization independent ring resonators using stress engineering is presented.

Citation Download Citation

Dan-Xia Xu, André Delâge, Siegfried Janz, and Pavel Cheben "Broadband polarization compensation in silicon-on-insulator components using cladding stress engineering", Proc. SPIE 7099, Photonics North 2008, 70991O (12 August 2008); https://doi.org/10.1117/12.807478

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