Temporal noise prediction for cooled infrared photodiodes array

Hubert Gardette; Eric Arrieta

doi:10.1117/12.798233

27 September 2008 Temporal noise prediction for cooled infrared photodiodes array

Hubert Gardette, Eric Arrieta

Proceedings Volume 7100, Optical Design and Engineering III; 710028 (2008) https://doi.org/10.1117/12.798233
Event: Optical Systems Design, 2008, Glasgow, Scotland, United Kingdom

Abstract

Noise Equivalent Temperature Difference is a key point for the evaluation of IR detectors and imaging systems. Our theoretical model of temporal noise predicts the NETD and responsivity of detectors with an accuracy better than 3 mK and 5 %, respectively in a large range of scene temperatures and integration times. This study clearly shows that we are able to estimate the temporal noise in any configuration and particularly for scene temperatures not easily accessible in standard laboratory conditions. Also, we can measure the amplitude of different noise contributions (1/f, white noise) and the FPA leakage current.

Citation Download Citation

Hubert Gardette and Eric Arrieta "Temporal noise prediction for cooled infrared photodiodes array", Proc. SPIE 7100, Optical Design and Engineering III, 710028 (27 September 2008); https://doi.org/10.1117/12.798233

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