A simple system for measuring small phase retardation of an optical thin film

T. N. Hansen; H. Fabricius

doi:10.1117/12.797180

26 September 2008 A simple system for measuring small phase retardation of an optical thin film

T. N. Hansen, H. Fabricius

Proceedings Volume 7101, Advances in Optical Thin Films III; 71011H (2008) https://doi.org/10.1117/12.797180
Event: Optical Systems Design, 2008, Glasgow, Scotland, United Kingdom

Abstract

This paper describes an experimental arrangement to determine phase retardations with changing signs around zero degree. In the experiment the phase retardation is caused by reflection from a non-periodic multilayer thin film reflector. A prism retarder is introduced in a common polarimetric measurement to act as a compensator in order to enable the measurement around zero degree phase retardation. Phase retardation within plus/minus a few degrees is measured in a broad spectral range using a fiber coupled spectrometer.

Citation Download Citation

T. N. Hansen and H. Fabricius "A simple system for measuring small phase retardation of an optical thin film", Proc. SPIE 7101, Advances in Optical Thin Films III, 71011H (26 September 2008); https://doi.org/10.1117/12.797180

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