Thermal infrared optical metrology using quadri-wave lateral shearing interferometry

Sabrina Velghe; Djamel Brahmi; William Boucher; Benoit Wattellier; Nicolas Guérineau; Riad Haïdar; Jérôme Primot

doi:10.1117/12.800325

2 October 2008 Thermal infrared optical metrology using quadri-wave lateral shearing interferometry

Sabrina Velghe, Djamel Brahmi, William Boucher, Benoit Wattellier, Nicolas Guérineau, Riad Haïdar, Jérôme Primot

Proceedings Volume 7113, Electro-Optical and Infrared Systems: Technology and Applications V; 71130X (2008) https://doi.org/10.1117/12.800325
Event: SPIE Security + Defence, 2008, Cardiff, Wales, United Kingdom

Abstract

We present the application of Quadri-Wave Lateral Shearing Interferometry (QWLSI), a wave front sensing technique, to characterize thermal infrared lenses for wavelengths within 8 and 14μm. Wave front sensing is not only a tool to quantify optical quality, but also to map the local (dust, scratches) or global possible defects. This method offers the crucial advantage that it yields an analyzed wave front without the use of a reference arm and consequent time consuming alignment. Moreover thanks to the acceptance of QWLSI to high numerical aperture beams, no additional optics is required. This makes lens characterization convenient and very fast. We particularly show the experimental characterization of single Germanium lens and finally present the characterization of complex optical imaging systems for high-performance infrared cameras. The analysis is made in conditions that are very close to the usual conditions of the camera use; that is to say, directly in the convergent beam and in polychromatic (black body) light.

Citation Download Citation

Sabrina Velghe, Djamel Brahmi, William Boucher, Benoit Wattellier, Nicolas Guérineau, Riad Haïdar, and Jérôme Primot "Thermal infrared optical metrology using quadri-wave lateral shearing interferometry", Proc. SPIE 7113, Electro-Optical and Infrared Systems: Technology and Applications V, 71130X (2 October 2008); https://doi.org/10.1117/12.800325

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Infrared radiation

Interferometry

Infrared imaging

Optical metrology

Thermography

Infrared technology

Wavefront sensors

Show All Keywords

Keywords/Phrases

Search In:

Publication Years