Multilayer waveguide structures investigated by the generalized m-line spectroscopy

Elzbieta Augusciuk

doi:10.1117/12.804521

13 June 2008 Multilayer waveguide structures investigated by the generalized m-line spectroscopy

Elzbieta Augusciuk

Proceedings Volume 7120, Optical Fibers and Their Applications 2008; 71200J (2008) https://doi.org/10.1117/12.804521
Event: Optical Fibers and Their Applications 2008, 2008, Bialowieza, Poland

Abstract

Parameters of a waveguide may be investigated with great resolution by using the m-line spectroscopy method. By depositing successive layers on the waveguide the propagation conditions of the structure may be changed. In this paper investigations of multilayer waveguide structures by the generalized m-line spectroscopy method have been presented. Multilayer waveguide structure is constructed by depositing successive layers on gradient index waveguide performed in glass by the ion-exchange method. The depositing layers are optimally selected in order to estimate their refractive indices, thicknesses and other parameters.

Citation Download Citation

Elzbieta Augusciuk "Multilayer waveguide structures investigated by the generalized m-line spectroscopy", Proc. SPIE 7120, Optical Fibers and Their Applications 2008, 71200J (13 June 2008); https://doi.org/10.1117/12.804521

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