Multilayer waveguide structures investigated by the generalized m-line spectroscopy

Elzbieta Augusciuk

doi:10.1117/12.804521

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13 June 2008 Multilayer waveguide structures investigated by the generalized m-line spectroscopy

Elzbieta Augusciuk

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Proceedings Volume 7120, Optical Fibers and Their Applications 2008; 71200J (2008) https://doi.org/10.1117/12.804521
Event: Optical Fibers and Their Applications 2008, 2008, Bialowieza, Poland

Abstract

Parameters of a waveguide may be investigated with great resolution by using the m-line spectroscopy method. By depositing successive layers on the waveguide the propagation conditions of the structure may be changed. In this paper investigations of multilayer waveguide structures by the generalized m-line spectroscopy method have been presented. Multilayer waveguide structure is constructed by depositing successive layers on gradient index waveguide performed in glass by the ion-exchange method. The depositing layers are optimally selected in order to estimate their refractive indices, thicknesses and other parameters.

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Elzbieta Augusciuk "Multilayer waveguide structures investigated by the generalized m-line spectroscopy", Proc. SPIE 7120, Optical Fibers and Their Applications 2008, 71200J (13 June 2008); https://doi.org/10.1117/12.804521

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