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13 June 2008 Multilayer waveguide structures investigated by the generalized m-line spectroscopy
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Proceedings Volume 7120, Optical Fibers and Their Applications 2008; 71200J (2008) https://doi.org/10.1117/12.804521
Event: Optical Fibers and Their Applications 2008, 2008, Bialowieza, Poland
Abstract
Parameters of a waveguide may be investigated with great resolution by using the m-line spectroscopy method. By depositing successive layers on the waveguide the propagation conditions of the structure may be changed. In this paper investigations of multilayer waveguide structures by the generalized m-line spectroscopy method have been presented. Multilayer waveguide structure is constructed by depositing successive layers on gradient index waveguide performed in glass by the ion-exchange method. The depositing layers are optimally selected in order to estimate their refractive indices, thicknesses and other parameters.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elzbieta Augusciuk "Multilayer waveguide structures investigated by the generalized m-line spectroscopy", Proc. SPIE 7120, Optical Fibers and Their Applications 2008, 71200J (13 June 2008); https://doi.org/10.1117/12.804521
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