Study of active width-reduced line-defect photonic crystal waveguides for high speed applications

Yongbo Tang; Bowen Wang

doi:10.1117/12.804275

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18 November 2008 Study of active width-reduced line-defect photonic crystal waveguides for high speed applications

Yongbo Tang, Bowen Wang

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Proceedings Volume 7135, Optoelectronic Materials and Devices III; 71350R (2008) https://doi.org/10.1117/12.804275
Event: Asia-Pacific Optical Communications, 2008, Hangzhou, China

Abstract

We study the electrical and optical characteristic of the width-reduced line-defect photonic crystal waveguides with lateral p-i-n structures on Silicon-on-Insulator substrates. A longitudinal-section-based electrical model is built to take the holes into consideration. Compared with the classical line-defect photonic crystal waveguides, the width reduced photonic crystal waveguide has much stronger capacity in optical confinement in plane, which can allow a narrower intrinsic layer that leads to a fast electric response.

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Yongbo Tang and Bowen Wang "Study of active width-reduced line-defect photonic crystal waveguides for high speed applications", Proc. SPIE 7135, Optoelectronic Materials and Devices III, 71350R (18 November 2008); https://doi.org/10.1117/12.804275

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