Paper
3 October 2008 3D investigation of photonics elements by means of interferometric and photoelastic tomography
Author Affiliations +
Proceedings Volume 7155, Ninth International Symposium on Laser Metrology; 71551Q (2008) https://doi.org/10.1117/12.814563
Event: Ninth International Symposium on Laser Metrology, 2008, Singapore, Singapore
Abstract
In the paper we present interferometric and photoelastic tomography methods applied for the 3D studies of refractive index (n) and birefringence (B) in photonics components such as optical fibres and microelements produced or replicated by a variety of novel technologies including deep proton writing (DPW) and hot embossing technology. The enhanced automated measurement and data analysis procedures are described and the experimental results obtained for microobjects working in transmission are given. Also the methodology to combine the tomographic data for full characterization of internal structure of 3D photonics elements is provided. The main samples under test are: microlens fabricated by DPW, Panda fibre and massive waveguide microinterferometer in the form of cuboids produced by hot embossing process.
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N. Kumar, M. Kujawinska, and P. Kniazewski "3D investigation of photonics elements by means of interferometric and photoelastic tomography", Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 71551Q (3 October 2008); https://doi.org/10.1117/12.814563
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KEYWORDS
Refractive index

Tomography

Microlens

Photonics

Interferometry

Birefringence

Photoelasticity

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