Measurement of photoelectrons decay in doping AgCl by microwave absorption phase-sensitive technique

Xiuhong Dai; Guoyi Dong; Haiyan Liu; Xiaowei Li; Shaopeng Yang; Li Han

doi:10.1117/12.806504

2 February 2009 Measurement of photoelectrons decay in doping AgCl by microwave absorption phase-sensitive technique

Xiuhong Dai, Guoyi Dong, Haiyan Liu, Xiaowei Li, Shaopeng Yang, Li Han

Proceedings Volume 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications; 71601P (2009) https://doi.org/10.1117/12.806504
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

The generation and decay of photoelectrons is an important factor in improving photographic efficiency of silver halide crystals. Microwave absorption phase-sensitive detection technology designed by our experiment group, was used to non-contact measure the transmission characteristic of photoelectronic in [Fe(CN)6]^4- uniformly-doped AgCl microcrystals. The signal of free and shallow-trapped photoelectrons were measured in-phase. It is found that the photoelectrons decay time in cubic AgCl microcrystals doped with [Fe(CN)6]^4- is longer than that of undoped samples at the first exposure time. And the photoelectrons decay time becomes longer with the doping concentration increasing. As is shown the doping centres can act as shallow electron traps. The results also show the photoelectrons decay time decreases significantly till becoming a constant after a few minutes exposure, and the constant is lower when the doping concentration is higher. By analysis the photoproduct is silver clusters with the characteristic of deep electron traps in the microcrystals. The measurement of photoelectrons by microwave absorption phase-sensitive detection technology can give evidence for the improving performance of the photosensitive material, optical information storage material and so on.

Citation Download Citation

Xiuhong Dai, Guoyi Dong, Haiyan Liu, Xiaowei Li, Shaopeng Yang, and Li Han "Measurement of photoelectrons decay in doping AgCl by microwave absorption phase-sensitive technique", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601P (2 February 2009); https://doi.org/10.1117/12.806504

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